Reliability Factors for Electronic Components in a Storage Environment
Abstract
The long-term storage reliability of electronic components in U.S. Army missile systems is approached from the viewpoint of materials degradation phenomena. A survey of missile systems is made to illustrate the wide range of tactical missiles and the different electronic technologies used. Data on world- wide environments, particularly temperature variations, are included to indicate the nature of storage environmental stresses acting on the missile and its electronic components. Failure processes resulting from these environmental stresses are discussed in terms of mechanical, thermal-mechanical, chemical and thermal effects. Further specific discussions are included on hermeticity, polymers, oxides and statistics. The conclusions and recommendations include several items which suggest changes in component reliability policies and recommendations are made for future research efforts in storage reliability. An extensive bibliography is included.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1977
- Accession Number
- ADA051151
Entities
People
- B. R. Livesay
- E. J. Scheibner
Organizations
- Georgia Tech