A New Look at the Role of Circuit Design on Electron Device Reliability.

Abstract

The effect of circuit design on the reliability of both solid-state and tube-type active devices is considered. A new design approach is presented based on the Ebers-Moll model equations indicating that the proper use of device transconductance can lead to a substantial reduction in circuit voltage with at most a slight reduction in available power output. At the same time, considerably reduced power dissipation and improved device reliability result. Typical problems are examined which show improvements obtained compared to the usual approach to circuit design based on transistor beta characteristics. These detailed examples show the use and benefits of the new design approach as compared to traditional methods. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1978
Accession Number
ADA051196

Entities

People

  • Keats A. Pullen Jr.

Organizations

  • Ballistic Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Amplifiers
  • Bipolar Junction Transistors
  • Circuits
  • Electron Tubes
  • Electronics Laboratories
  • Field Effect Transistors
  • Frequency
  • Impedance
  • Instability
  • Integrated Circuits
  • Npn Transistors
  • Power
  • Radio Frequency Amplifiers
  • Resonant Circuits
  • Transistor Amplifiers
  • Transistors
  • Tuned Circuits

Readers

  • Brain and Cognitive Science; Experimental Psychology; Cognitive Neuroscience
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics