Electrical Characterization of Linear Integrated Circuits.

Abstract

This report covers the work performed by General Electric Ordnance Systems pertaining to the electrical characterization of linear integrated circuits. The period of report is July 1976 to June 1977. The effort was divided into three tasks; (1) New electrical characterization, (2) Resolution of problems with existing slash sheets, and (3) Rewrite of preliminary slash sheets. New characterization was performed on five different quad op-amp device types having wide usage in military systems. A slash sheet emanated, once confidence was established in choice of electrical parameters, limits, test circuits and test grouping. Work was begun to characterize quad comparators. The 139 commerical device type was chosen for standardization because of its popularity. Parts were procured and preliminary analysis began. This effort will be completed on a follow-on contract. Extensive evaluation and testing was necessary to resolve the problems that was prevalent on existing slash sheets. The slash sheets in question were /101 (Op-Amps), /102 (volt regulators) /103 (Comparators), /10404 (line receivers) and /108 (transistor arrays). Users/manufacturers were contacted to isolate problems and parts were procured and tested. Data was analyzed and the slash sheets were revised where necessary to allow qualified sources to produce relevant parts. Finally, problems were analyzed for existing slash sheets in much the same way that was applied to preliminary sheets. Lengthy comments submitted by manufacturers and/or users suggested the need for rewrite. After extensive review, /107 (fixed voltage regulators) and /109 (timers) were issued.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1978
Accession Number
ADA052357

Entities

People

  • Herbert Labb
  • Jerry Yaple
  • John S. Kulpinski
  • Richard Paskowsky
  • Theodore Simonsen

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Command Control Communications
  • Dynamic Tests
  • Engineering
  • High Temperature
  • Integrated Circuits
  • Life Tests
  • Operational Amplifiers
  • Plastic Explosives
  • Power Supplies
  • Procurement
  • Reliability
  • Test And Evaluation
  • Test Equipment
  • Test Methods
  • Voltage
  • Waveforms

Readers

  • Business Analytics
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design