Semiconductor Device Damage Assessment for the INCA Program--A Probabilistic Approach.

Abstract

Two methods are described for estimating the probability that a given semiconductor device will be damaged by an electrical transient. Both methods are based on existing device damage data which were obtained by step-stressing devices to failure, using rectangular pulses. Both methods require calculation of the time-dependent power waveform in the device, due to application of the transient. One method employs only the largest peak of this power waveform, while the other includes the entire waveform in a convolution integral. Modifications to the DAMTRAC circuit-analysis program are presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1978
Accession Number
ADA052433

Entities

People

  • Robert L. Williams

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Energy and Power Technologies
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Circuit Analysis
  • Computer Programs
  • Computer Science
  • Computers
  • Convolution Integrals
  • Damage Assessment
  • Department Of Defense
  • Electronic Equipment
  • Electronics
  • Electronics Laboratories
  • New York
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • War Colleges
  • Waveforms

Fields of Study

  • Engineering

Readers

  • Computer Science.
  • Explosive Engineering.
  • Microwave Engineering.

Technology Areas

  • Microelectronics