OWL II Diode Study.

Abstract

An experimental program performed on the OWL II pulsed electron beam accelerator with mean electron energy of 950 keV and electron beam energy of 80 kJ has been accomplished. The reliability of the accelerator was shown to be greater than 90 percent at the 90 percent confidence level. The repeatability of the accelerator can be characterized by + or - 4 percent MSD (mean square deviation) of beam energy in the diode, + or - 2 percent MSD of mean electron energy in the diode, and + or - 8 percent MSD of average fluence at target location. Electron beams with areas in excess of 400 sq cm, depths of penetration in excess of 0.6 gm/sq cm and peak doses ranging from 25 to 100 cal/gm were characterized for future thermal structural response testing. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1977
Accession Number
ADA052578

Entities

People

  • Charles Stallings
  • Kendall Childers

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Data Analysis
  • Dielectrics
  • Diodes
  • Electron Beams
  • Electron Energy
  • Electrons
  • Emission
  • Energy
  • Geometry
  • Graphitic Materials
  • Magnetic Fields
  • Materials Laboratories
  • Measurement
  • Oscilloscopes
  • Reliability
  • Structural Response
  • Test And Evaluation

Fields of Study

  • Physics

Readers

  • Materials Science (Mechanical Engineering).
  • Mathematics or Statistics
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems