Specifications for Microcircuit Electrical Overstress Tolerance.

Abstract

The objective of this program is to develop an inexpensive electrical overstress quality assurance sample qualification test to be applied to all future Air Force microcircuit purchases. The maximum ratings presently specified refer only to dc limits and do not reflect the ability of a microcircuit to withstand short duration, high amplitude transients. The new electrical overstress tolerance specification has been developed to provide this information.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1978
Accession Number
ADA052814

Entities

People

  • Robert J. Antinone

Organizations

  • Braddock Dunn & McDonald

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Databases
  • Electronics Industry
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Measurement
  • Metal Oxide Semiconductors
  • Modules (Electronics)
  • Nand Gates
  • Pulse Generators
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • Test Equipment
  • Waveforms

Fields of Study

  • Engineering
  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems