Storage Reliability of Missile Materiel Program, Monolithic Bipolar SSI/ MSI Digital and Linear Integrated Circuit Analysis

Abstract

This report documents findings on the non-operating reliability of monolithic bipolar SSI/MSI digital and linear integrated circuits. Real time storage and accelerated testing results were analyzed and integrated to develop a non-operating reliability prediction model. Failure mechanisms are also discussed in detail.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1978
Accession Number
ADA053415

Entities

People

  • Dennis F. Malik

Organizations

  • RTX

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Beam Leads
  • Circuit Analysis
  • Crystal Lattices
  • Crystal Structure
  • Data Analysis
  • Electronic Components
  • Failure Mode And Effect Analysis
  • High Temperature
  • Integrated Circuits
  • Life Tests
  • Manufacturing
  • Material Degradation Processes
  • Materials
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • Transistors

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.