Some Aspects of X-ray Topography.

Abstract

The experimental technique of x-ray topography is reviewed for its applicability to the materials characterisation work at W.R.E. Two variations of the technique are critically examined as to the extent of sample covered, resolution attainable and equipment required. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1977
Accession Number
ADA053696

Entities

People

  • R. S. Seymour

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Bragg Angle
  • Crystal Defects
  • Crystal Growth
  • Crystal Lattices
  • Crystal Structure
  • Crystals
  • Department Of Defense
  • Diffraction
  • Materials
  • Photographic Film
  • Photographic Plates
  • Radiation
  • Security
  • Single Crystals
  • Topography
  • X Rays
  • X-Ray Detectors

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design