Analytic Methods for Studying the Fiber/Matrix Interface,

Abstract

In order to understand the mechanical behavior of metal matrix-graphite composites, it is necessary that the fiber-matrix interface be well characterized. This is of particular importance for transverse loading of the composite. In this paper some of the more successful techniques that have been used to make some measurements concerning the nature of the interface are described. The tools discussed are scanning electron microscopy (SEM), Auger electron spectroscopy (AES), inert ion sputtering (IIS), secondary ion mass spectroscopy (SIMS), and ion microprobe mass analysis (IMMA).

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1978
Accession Number
ADA056049

Entities

People

  • Duane Finello
  • H. L. Marcus

Organizations

  • University of Texas at Austin

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Chemical Analysis
  • Chemistry
  • Composite Materials
  • Electron Energy
  • Electron Microscopy
  • Electron Spectroscopy
  • Electrons
  • Graphitic Materials
  • Materials Science
  • Metal Matrix Composites
  • Microscopes
  • Microscopy
  • Scanning Electron Microscopy
  • Spectra
  • Spectroscopy

Fields of Study

  • Materials science

Readers

  • Reinforced Composite Materials
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene