A Study of a Standard BIT Circuit.
Abstract
The desirability of reducing life cycle costs of complex digital systems is obvious. The mechanisms for accomplishing this reduction and the approach(es) to seeking these mechanisms are not so obvious. One approach which has been successfully taken by the Navy is to utilization of standard modular hardware to minimize equipment sparing costs by reducing the number and types of modules spared. In addition, the use of modular digital hardware on mobile weapon platforms having long duration missions precludes access to large spare equipment inventories (e.g., ballistic missile submarines. Utilization of modular digital hardware in such cases allows equipment repair to be promptly effected and thereby increases system availability. Thus the Navy standard modular hardware program such as the Standard Electronic Module (SEM) program lead directly to life cycle cost reduction and increased system availability. The overall objective of this work is to explore ways to further reduce digital system life cycle cost and increase system availability through improved fault detection and isolation techniques. The particular approach taken in this study involves the use of built-in-test (BIT) circuits at the replaceable unit level to facilitate fault detection and isolation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1977
- Accession Number
- ADA056147
Entities
People
- J. B. Clary
- J. W. Gault
- R. A. Whisnant
- R. D. Alberts
- S. J. Weikel
Organizations
- RTI International