Analysis of Impurities in Composition B by Thin Layer Chromatography
Abstract
A thin layer chromatographic procedure was developed to identify alpha-TNT associated impurities in Composition B. The method involved reducing RDX and alpha-TNT levels in the solubilized Composition B sample before two- dimensional chromatographic developing. Impurities were identified after applying ethylenediamine reagent. Color development, fluorescence quenching, and R sub f values were compared to those established for a variety of impurities known to be present in Military Grade alpha-TNT. Six fragments from a Composition B warhead (which did not premature but was taken from the same lot as those suspected of premature functioning) and a control sample of Composition B obtained from the Holston Army Ammunition Plant were analyzed and compared. The analyses revealed the presence of m-nitrotoluene impurity in only the fragment samples suspected of premature initiation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1978
- Accession Number
- ADA056313
Entities
People
- M. Gilford
- T. H. Chen
Organizations
- United States Army Armament Research, Development and Engineering Center