Automated Test Design.

Abstract

A methodology for designing tests to diagnose and isolate failures in analog circuits has been developed and implemented as a computer program. The input to the program consists of a circuit description and a list of possible failures as changes to the nominal unit under test. The output of the program consists of a report showing how well the failures can be isolated, the tests to be performed, and the diagnosis selection logic which combines these tests to isolate the faulty components. The final output is produced in the NOPAL (nonprocedural OPAL) test specification language. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1978
Accession Number
ADA056660

Entities

People

  • Cihan Tinaztepe

Organizations

  • Moore School of Electrical Engineering

Tags

Communities of Interest

  • Advanced Electronics
  • C4I
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Circuit Analysis
  • Computer Programming
  • Computer Programs
  • Computer Science
  • Computers
  • Digital Circuits
  • Electronic Circuits
  • Electronic Components
  • Engineers
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Information Science
  • Measurement
  • Semiconductor Devices
  • Semiconductors
  • Test Equipment

Fields of Study

  • Engineering

Readers

  • Artificial Intelligence
  • Computational Linguistics
  • Software Engineering