MM and T Program to Establish Production Techniques for the Automatic Detection and Qualification of Trace Elements Present in the Production of Microwave Semiconductors.
Abstract
A project was undertaken to improve the yield in the manufacture of microwave semiconductor diodes by establishing the correlation of product yields to the incidence of contaminants in the reagents and solvents used in the manufacturing process and using these data to model the process for optimization of the yield. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1978
- Accession Number
- ADA056957
Entities
People
- Roy W. Spacie
Organizations
- Harris Corporation