Characterization of Complex Microprocessors and Support Chips.

Abstract

The objective of this effort was to develop high test confidence level functional tests and parametric tests for selected microprocessors and microprocessor support devices; and then generate MIL-M-38510 slash sheets for them which conformed to military standards. This included worst case test situations, critical timing and generation of new test procedures where present or accepted methods no longer apply. User and manufacturer comments made to microprocessor slash sheets/400 and /420 developed under a previous contract were reviewed with device manufacturers and changes were made to the slash sheets where necessary. Military qualification of these devices was supported also as it applied to the slash sheet test mehtods and procedures. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1978
Accession Number
ADA057079

Entities

People

  • Thomas M. Ostrowski

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Cyber

DTIC Thesaurus Topics

  • Amplifiers
  • Automatic
  • Clocks
  • Computer Programs
  • Computer Simulations
  • Computers
  • Engineering
  • Impedance
  • Instruction Set Architecture
  • Military Standards
  • Plastic Explosives
  • Self Assembly
  • Simulations
  • Standards
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Readers

  • Computational Modeling and Simulation
  • Software Engineering