Comparison Study of the Five Transistor-Transistor-Logic (TTL) Families and Emitter Coupled Logic (ECL).

Abstract

This report describes the radiation test response of the five transistor-transistor-logic (TTL) technologies and the emitter-coupled-logic (ECL) technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND (TTL) or NOR (ECL) gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technology's radiation response. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1978
Accession Number
ADA058093

Entities

People

  • Michael G. Knoll

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Circuit Testers
  • Circuits
  • Department Of Defense
  • Electrical Engineering
  • Jet Propulsion
  • Libraries
  • Nand Gates
  • Plastic Explosives
  • Radiation Effects
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation
  • Test Methods
  • Transistors
  • United States

Readers

  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.