A Pattern Deformational Model and Bayes Error-Correcting Recognition System.

Abstract

Various types of pattern deformations are investigated from the syntactic point of view and categorized into two major types: local deformations and structural deformations. Random noise, distortion variations, and substitutions, of pattern primitives belong to the former; syntactic errors due to pattern structural changes, such as primitive deletions and insertions, belong to the latter. Every observed pattern can be regarded as transformed from a pure pattern through these two types of deformations. An error-correcting parsing scheme for local deformations optimum in the Bayes sense is proposed. Two structure-preserved error-correcting parsers, one for string languages, the other tree languages, are also presented. Finally, further researches concerning error-correcting parsings for structural deformations and a complete error-correcting systems for both kinds of deformations are suggested.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1978
Accession Number
ADA058791

Entities

People

  • King Sun Fu
  • W. H. Tsai

Organizations

  • Purdue University

Tags

Communities of Interest

  • C4I

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Classification
  • Curvature
  • Distortion
  • Errors
  • Grammars
  • Language
  • Machine Learning
  • Measurement
  • Pattern Recognition
  • Probability
  • Production
  • Random Variables
  • Recognition
  • Shape
  • Terminals

Readers

  • Computational Linguistics
  • Computer Programming and Software Development.
  • Materials Science and Engineering.