'Reliability Growth' as an Artifact of Renewal Testing

Abstract

It is shown that observed 'reliability growth' may be an artifact of limited-horizon renewal testing. The 'growth' of several estimators of failure rate and MTBF with test time is examined for a stationary renewal process. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1978
Accession Number
ADA059860

Entities

People

  • William S. Jewell

Organizations

  • University of California, Berkeley

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Algorithms
  • Artifacts
  • California
  • Complex Systems
  • Engineering
  • Engineers
  • Estimators
  • Failure Mode And Effect Analysis
  • Intervals
  • Procurement
  • Reliability
  • Scientific Research
  • Stationary
  • United States
  • United States Government

Fields of Study

  • Engineering

Readers

  • Brain and Cognitive Science; Experimental Psychology; Cognitive Neuroscience
  • Statistical inference.