The Measurement of Residual Stresses by X-Ray Diffraction Techniques

Abstract

The idea of measuring residual stresses by x-ray diffraction was first proposed by Lester and Aborn (1925). In this report the main aim is to present, in a single chapter, many of the recent instrumental advances and to explain the fundamental limitations associated with this measurement. Many current applications are described in those areas where the measurement has already proven to be useful.

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Document Details

Document Type
Technical Report
Publication Date
Sep 26, 1978
Accession Number
ADA060349

Entities

People

  • Jerome B. Cohen
  • Michael R. James

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Air Platforms
  • Cyber
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Crystal Structure
  • Diffraction
  • Geometry
  • Heat Treatment
  • Manufacturing
  • Materials
  • Materials Engineering
  • Materials Laboratories
  • Materials Science
  • Measurement
  • Mechanical Properties
  • Mechanical Working
  • Mechanics
  • Phase Transformations
  • Shot Peening
  • Two Dimensional

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design