Accelerated Testing on the Reliability of Semi-Conductor Elements,

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1978
Accession Number
ADA060707

Entities

People

  • Henryk Gladysz
  • Jerzy Kolodziejski

Organizations

  • National Air and Space Intelligence Center

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accelerated Testing
  • Army Equipment
  • Coefficients
  • Direct Current
  • Electrical Loads
  • Failure Mode And Effect Analysis
  • Foreign Technology
  • Laboratory Tests
  • Large Scale Integration
  • Materials
  • Reliability
  • Short Circuits
  • Standards
  • Temperature Coefficients
  • Test And Evaluation
  • Thermal Resistance
  • Transistors