Fault Analysis in Electronic Circuits and Systems. II.

Abstract

A summary of several research projects in the fault analysis area. Specific topics include test point sections, the formulation of a measure of testability for analog electronic circuits, test frequency selection, and fault diagnosis in linear and affine circuits. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1978
Accession Number
ADA060941

Entities

People

  • H. M. S. Chen
  • K. S. Lu
  • N. Sen
  • R. Saeks
  • S. Sangani

Organizations

  • Texas Tech University

Tags

Communities of Interest

  • Advanced Electronics
  • C4I
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algebra
  • Algorithms
  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Complex Numbers
  • Computational Science
  • Computers
  • Electrical Engineering
  • Electronic Circuits
  • Electronics
  • Equations
  • Linear Algebraic Equations
  • Resistance
  • Test Equipment
  • Transfer Functions
  • Vector Spaces

Fields of Study

  • Physics

Readers

  • Business Analytics
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Mathematical Modeling and Probability Theory.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems