A Study of Truncated Sequential Probability Ratio Tests for Reliability Testing and Some New Results.
Abstract
This report documents a new analytical procedure which can be used to analyze and evaluate sequential probability ratio test plans used for reliability demonstration. The methodology developed is capable of evaluating such test plans when the two lines which define the accept, reject regions are either parallel or nonparallel, with or without truncation considerations. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1978
- Accession Number
- ADA062172
Entities
People
- Amrit L. Goel
Organizations
- Syracuse University