Radiation Hardened Microprocessor Technology Study.

Abstract

This report discusses four LSI technologies-NMOS, TTL, CMOS and I2L-relative to their current and projected capabilities in both the commercial and the radiation hardened markets. The state-of-the-art in radiation hardened digital electronics is described along with a discussion of design techniques that may be used to apply LSI to hardened systems. Finally, a preliminary analysis of radiation testing of a microprocessor bit slice is provided. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1978
Accession Number
ADA063902

Entities

People

  • D. Z. Harbert
  • J. P. Spratt

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Artificial Satellites
  • Computer Programs
  • Engineers
  • Failure Mode And Effect Analysis
  • Fish
  • Gamma Rays
  • Integrated Circuits
  • Intercontinental Ballistic Missiles
  • Ionizing Radiation
  • Jet Propulsion
  • Large Scale Integration
  • Manufacturing
  • Plastic Explosives
  • Radiation Effects
  • Semiconductors
  • Space Systems
  • Test And Evaluation

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics