X-Ray Dose Enhancement, II.
Abstract
A discussion of x-ray dose enhancement at material interfaces is presented including definition, problem identification and worst-case estimation, prediction techniques, and analysis of dose enhancement characteristics. Empirical, analytical, and Monte Carlo prediction techniques are discussed. Dose enhancement calculations for various interface configurations, continuous x-ray sources, and thin high-Z layers are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1978
- Accession Number
- ADA063954
Entities
People
- W. L. Chadsey