Combined Effect of Aging and Neutron Irradiation on Semiconductor Avalanche Voltage.

Abstract

This report presents the results of an investigation into the combined effects of neutron irradiation and aging on the breakdown voltage in transistors. The combined effect was found to be a simple additive effect. It was determined from other results of the investigation that transistor parameters change as a function of the number of times the breakdown voltage is measured and that the gain of the transistor is degraded more if the device has been aged before irradiation than if the device has been irradiated and then aged. This last result brings into question the validity of present methods of establishing neutron susceptibility levels. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1978
Accession Number
ADA065074

Entities

People

  • Victor W. Ruwe

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Computer Programs
  • Data Analysis
  • Databases
  • Electronic Components
  • Electronics
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Information Science
  • Life Tests
  • Modules (Electronics)
  • Neutron Bombardment
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Test Methods
  • Three Dimensional
  • Transistors

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Nuclear and Radiation Engineering.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics