Temperature Dependence of the Resonant Frequency of Electroded Doubly-Rotated Quartz Thickness-Mode Resonators.
Abstract
A system of approximate equations for the determination of thermal stresses in piezoelectric plates with large thin films of a different material plated on the surfaces is derived. The plate equations are obtained by making a suitable expansion of the pertinent variables in the thickness coorinate, inserting the expansion in the appropriate variational principle and integrating with respect to the thickness in the manner of Mindlin. Conditions resulting in both extensional and flexural stresses are considered and the full anisotropy of the quartz is included in the treatment. The particular case of purely extensional thermal stresses resulting from large electrodes of equal thickness plated on the major surfaces of doubly-rotated quartz thickness-mode resonators is treated in detail. The changes in resonant frequency resulting from the thermally induced biasing stresses and strains are determined from an existing perturbation equation. Calculations, using the newly defined first temperature derivatives of the fundamental elastic constants of quartz, are performed for large gold electrodes on doubly-rotated quartz plates. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1979
- Accession Number
- ADA065101
Entities
People
- B. K. Sinha
- Harry F. Tiersten
Organizations
- Rensselaer Polytechnic Institute