Non-Localized Impact Ionization in Semi-Conductors.

Abstract

Studies have been directed towards improving the understanding of the 'nonlocalized' nature of impact ionization: i.e., the fact that carriers must be field accelerated by at least the threshold energy for impact ionization before they can create an electron-hole pair. Work has been directed specifically towards GaAs and InP in Schottky barrier configurations. For GaAs, studies have shown that momentum and energy conservation impose an effective density of available states that grows as the 2 1/2 power of the energy in excess of threshold as opposed to the 3 1/2 and 5 power alternatives. It has also been that the capture cross sections that we can deduce from cascade production by high energy primary radiation are consistent with the modeling needed for the ionization coefficient. This problem was investigated using a Markov formulation and the results of the energy required per pair produced are strongly influenced by the ratio of pair production cross section to phonon scattering cross section at a primary energy of twice the threshold energy. The energy dependence about this energy serves mainly to perturb the result.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1979
Accession Number
ADA065186

Entities

People

  • C. R. Crowell
  • Chung-whei Kao

Organizations

  • University of Southern California

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Band Structures
  • Charge Carriers
  • Compound Semiconductors
  • Crystal Lattice Vibrations
  • Electric Fields
  • Electronics
  • Electrons
  • Energy Conservation
  • High Energy
  • Momentum
  • Pair Production
  • Probability
  • Scattering
  • Security
  • Semiconductors
  • Solid State Electronics
  • Spatial Distribution

Fields of Study

  • Physics

Readers

  • Plasma Physics.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Solar Physics

Technology Areas

  • Microelectronics