Computer-Aided Analysis of RFI Effects in Integrated Circuits,

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Document Details

Document Type
Technical Report
Publication Date
Jun 20, 1978
Accession Number
ADA067641

Entities

People

  • C. E. Larson
  • J. J. Whalen
  • J. M. Roe
  • J. Tront

Organizations

  • University at Buffalo

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Circuit Analysis
  • Circuits
  • Electrical Engineering
  • Electromagnetic Radiation
  • Electronic Circuits
  • Electronic Equipment
  • Engineering
  • Generators
  • Impedance
  • Integrated Circuits
  • Nand Gates
  • New York
  • Semiconductor Devices
  • Semiconductors
  • Standards
  • Transistors