A Design Guide for Built-in-Test (BIT)

Abstract

This report summarizes available information of use in designing built-in-test (BIT) capabilities in electronic systems. It describes the various types of BIT, design considerations and examples, data used in BIT design, display options, coupling and shielding considerations, and optimization models.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1979
Accession Number
ADA069384

Entities

People

  • Anthony Coppola

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Circuit Analysis
  • Circuit Boards
  • Computer Programming
  • Computer Programs
  • Computers
  • Detection
  • Digital Circuits
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Logic Gates
  • Maintenance
  • Measurement
  • Test And Evaluation
  • Test Equipment
  • Transducers
  • Warning Systems

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Software Engineering

Technology Areas

  • Microelectronics