Reliability Prediction Models for Microwave Solid State Devices

Abstract

Martin Marietta Corporation conducted a 12 month program to develop base failure rates and failure rate mathematical models for microwave solid state devices. These models are provided in the format of MIL-HDBK-217B. More than 8.75 billion part hours of operating field data were collected from industrial and Government data sources. Data were analyzed and sorted manually. Conclusions are summarized in the revised base failure rates and mathematical models described. Failure rates developed for those devices already included in MIL-HDBK-217B are compared with present failure rates. Devices not presently included in MIL-HDBK-217B are listed with new pages for inclusion in MIL-HDBK- 217B.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1979
Accession Number
ADA069386

Entities

People

  • George F. Guth

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Gunn Diodes
  • Microwave Frequency
  • Modules (Electronics)
  • Oscillators
  • P-N Junctions
  • Power Electronics
  • Radar
  • Radio Frequency
  • Schottky Diodes
  • Semiconductor Devices
  • Semiconductors
  • Transducers
  • Varactor Diodes

Readers

  • Government Contracting/Procurement.
  • Software Engineering