Stress Analysis from Powder Diffraction Patterns.

Abstract

A brief review of the method of measuring residual stresses in polycrystalline materials with X-rays is given. The effect of counting statistics on precision is discussed as well as factors that affect accuracy. Beam penetration, stress gradients, and the form of the stress tensor can each seriously affect accuracy, if traditional methods are employed, and practical procedures to deal with such situations are outlined. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 14, 1979
Accession Number
ADA069824

Entities

People

  • Heiner Doelle
  • Jerome B. Cohen
  • Michael R. James

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Air Platforms
  • C4I

DTIC Thesaurus Topics

  • Accuracy
  • Curvature
  • Data Analysis
  • Detectors
  • Diffraction
  • Geometry
  • Manufacturing
  • Materials
  • Materials Science
  • Measurement
  • Metallurgy
  • Residual Stress
  • Rotation
  • Shear Stresses
  • Stress Analysis
  • Stresses
  • X Rays

Readers

  • Regression Analysis.
  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.