A Study of Flicker Noise in MOSFETS.

Abstract

Considerable progress was made in two areas: (1) Better understanding of flicker noise in MOSFETs. (2) Better understanding of hot electron noise in JFETs. In addition, considerable clarification was obtained in the understanding of flicker noise problems in general. This report summarizes the research efforts in the above areas. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1979
Accession Number
ADA070313

Entities

People

  • A. Van Der Ziel

Organizations

  • University of Minnesota

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Demographic Cohorts
  • Electric Fields
  • Electrons
  • Energy
  • Fermi Levels
  • Field Effect Transistors
  • Frequency
  • Heat Of Activation
  • Inversion
  • Military Research
  • Minnesota
  • Mobility
  • Resistance
  • Scattering
  • Semiconductor Devices
  • Semiconductors

Readers

  • Acoustics.
  • Semiconductor Device Technology
  • Theoretical Analysis.

Technology Areas

  • Microelectronics