Computerized Pattern Recognition Applied to Ni-Cd Cell Lifetime Prediction.
Abstract
Computerized pattern recognition was used to look for characteristics of new nickel-cadmium spacecraft cells which would be predictive of later performance under stressful conditions. It was found that the changes in voltage while a cell was being charged could be used to make a rough estimate of its lifetime. The standard deviation in the predicted lifetime values was somewhat smaller than the standard deviation of the lifetime distribution as a whole, and there are indications that a more extensive data set would yield better results. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1978
- Accession Number
- ADA070344
Entities
People
- S. P. Perone
- W. Arthur Byers
Organizations
- Purdue University