Test Program Set Cost Algorithm.

Abstract

The Test Program Set Cost Algorithm provides a methodology for identifying and quantifying the funding costs of major tasks in Test Program Sets (TPS's) development. Areas that are addressed by the study include the learning curve effect, impact of ATE maturity, impact of UUT (Unit Under Test) Testability, effect of design guides on development and life-cycle costs, management-controlled cost factors, utilization of Automatic Test Program Generation (ATPG), development costs vs. life-cycle costs, fault insertion and customer 'sell-off', and commercial vs. military support. The basic algorithm deals with the analysis, coding, checkout and sell-off of a test program set but other factors such as overhead support, interface device design, ATE compatibility, etc., are discussed. The application and usage of the algorithm should provide a valuable estimating tool to assess costs associated with Test Program Set development. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
May 01, 1979
Accession Number
ADA070629

Entities

People

  • Al V. Robertson
  • D. James Zingg
  • Dave Mcintyre

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accuracy
  • Algorithms
  • Circuit Analysis
  • Computer Programming
  • Computer Programs
  • Computers
  • Cost Estimates
  • Costs
  • Data Storage Systems
  • Databases
  • Engineers
  • Intercontinental Ballistic Missiles
  • Life Cycle Costs
  • Life Cycles
  • Measurement
  • Test Equipment
  • Test Methods

Fields of Study

  • Engineering

Readers

  • Industrial Economics
  • Software Engineering
  • Software Engineering.