A Survey of LSI Test Methodology.

Abstract

This report discusses different test methods available for testing Logic Circuits and Large Scale Integrated Circuits (LSI) from Structural, Functional and Random testing viewpoints. Many test schemes have been proposed in the literature and this report attempts to classify the different test schemes into two basic approaches, nmemely, test generation and test application. An attempt is also made to indicate the philosophy underlying different test equipment. The report also incorporates a brief introduction to digital testing which should enable engineers unfamilar with the concepts of digital testing to read this report with minimum external references. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1979
Accession Number
ADA070733

Entities

People

  • R. M. Mattheyses
  • U. V. Gumaste

Organizations

  • Clarkson University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Computer Programming
  • Computers
  • Crystal Structure
  • Digital Circuits
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Large Scale Integration
  • Logic
  • Logic Devices
  • Logic Gates
  • Manufacturing
  • Numbers
  • Semiconductors
  • Software Testing
  • Test Equipment
  • Test Methods
  • Very Large Scale Integration

Readers

  • Aerospace Test and Evaluation
  • Computer Engineering
  • Theoretical Analysis.