Advanced Archival Memory

Abstract

This report covers the effort for the first eight months of 1978. The contract has been redirected from the ion damage writing concept to one based on electron beam milling of thin layers of selenium-arsenic on silicon diode detectors. Background surrounding the redirection can be found in the introduction. Work in the reporting period has concentrated on evaluating two all-electron beam storage concepts (alloy junction and electron beam milling). The electron beam milling approach has been chosen, and an advanced high current electron probe is being purchased for use in evaluating this storage concept.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1979
Accession Number
ADA070776

Entities

People

  • C. G. Kirkpatrick
  • G. E. Possin
  • H. G. Parks
  • M. S. Adler
  • P. V. Gray

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Detectors
  • Dwell Time
  • Electron Beams
  • Electron Scattering
  • Electronics Laboratories
  • Field Emission
  • Glass Transition Temperature
  • Heat Energy
  • Heat Of Vaporization
  • Latent Heat
  • Measurement
  • Phase Diagrams
  • Semiconductors
  • Surface Temperature
  • Thermal Conductivity
  • Transition Temperature
  • Transitions

Fields of Study

  • Physics

Readers

  • Manufacturing Engineering.
  • Pulsed Power and Plasma Physics.
  • Software Engineering

Technology Areas

  • Directed Energy
  • Microelectronics