The Study and Identification of Residual Donor Species in High Purity Semiconductors.

Abstract

A Fourier transform spectroscopy apparatus has been constructued. This apparatus uses photothermal ionization to probe the energy level structure of shallow impurities in semiconductors. The present form of the apparatus, and progress made in modifying it to increase its resolution are described in detail. An account of our immediate and possible furture applications of the apparatus is given. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1979
Accession Number
ADA071059

Entities

People

  • Gregory E. Stillman

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Acquisition
  • Amplifiers
  • Conduction Bands
  • Current Amplifiers
  • Data Acquisition
  • Electrical Conductivity
  • Electronics
  • Energy Levels
  • Fiber Optics
  • Ground State
  • Magnetic Fields
  • Materials
  • Materials Laboratories
  • Measurement
  • Spectra
  • Spectrometers
  • Spectroscopy

Readers

  • Materials Science and Engineering.
  • Pulsed Power and Plasma Physics.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics