MNOS BORAM Manufacturing Methods and Technology Project.

Abstract

A manufacturing methods project has been initiated to establish a pilot production line for metal nitride oxide semiconductor (MNOS) block oriented random access memory (BORAM) multichip hybrid circuits. This report presents an analysis of test results from an 8900 hour endurance-retention experiment. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1979
Accession Number
ADA071413

Entities

People

  • J. E. Brewer
  • R. C. Lyman

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computer Programs
  • Computers
  • Data Analysis
  • Detection
  • Electronics
  • Engineering
  • Management Personnel
  • Manufacturing
  • Measurement
  • Memory Devices
  • Military Research
  • Semiconductors
  • Standards
  • Stresses
  • Test And Evaluation
  • Test Methods
  • Test Sets

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics