Long-Term Dormant Storage of Microelectronic Components.

Abstract

An analysis is presented of the long-term dormant storage test data experimentally accumlated on two microelectronic devices. All relevant information on the experimental test program was reviewed very carefully. The existence of error sources, anomalous data, and data acquisition discontinuities was identified. The unanticipated final result of the analysis was that the data collected was of an insufficient quality to enable the identification of any aging behavior as a function of time, temperature, or operational stress. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1979
Accession Number
ADA071794

Entities

People

  • A. L. Dudley
  • R. H. Dickhaut

Tags

DTIC Thesaurus Topics

  • Acquisition
  • Data Acquisition
  • Data Analysis
  • Databases
  • Electrical Equipment
  • Electronic Components
  • Environment
  • Failure Mode And Effect Analysis
  • Information Science
  • Instrumentation
  • Materials
  • Measurement
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Sequences
  • Test Sets

Readers

  • Data Mining and Knowledge Discovery.
  • Software Engineering
  • Theoretical Analysis.

Technology Areas

  • Microelectronics