Acoustic Wave Measurements of Semiconductor Parameters.

Abstract

Various types of acoustic surface wave techniques for measuring the parameters ofa semiconductor are discussed in this paper. These include techniques to measure mobility, carrier density, surface state density, and trapping time in surface states. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1977
Accession Number
ADA071942

Entities

People

  • Gordon S. Kino

Organizations

  • Stanford University

Tags

DTIC Thesaurus Topics

  • Acoustic Measurement
  • Acoustic Waves
  • Attenuation
  • Conduction Bands
  • Electrons
  • Energy Bands
  • Losses
  • Measurement
  • Piezoelectric Materials
  • Schottky Diodes
  • Semiconductor Devices
  • Semiconductors
  • Signal Processing
  • Surface Acoustic Wave Devices
  • Surface Acoustic Waves
  • Surface Properties
  • Surface Waves

Readers

  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Semiconductor Device Technology
  • Software Engineering

Technology Areas

  • Microelectronics