A Bayesian Nonparametric Approach to Reliability.
Abstract
It is suggested that problems in a reliability context may be handled by a Bayesian non-parametric approach. A stochastic process is defined whose sample paths may be assumed to be either increasing hazard rates or decreasing hazard rates by properly choosing the parameter functions of the process. The posterior distribution of the hazard rates are derived for both exact and censored data. Bayes estimates of hazard rates,c.d.f.'s, densities, and means, are found under squared error type loss functions. Some simulation is done and estimates graphed to better understand the estimators. Finally, estimates of the c.d.f. from some data in a paper by Kaplan and Meier are constructed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 10, 1979
- Accession Number
- ADA072431
Entities
People
- Purushottam Laud
- Richard L. Dykstra