Line Access Test System (LATS).

Abstract

This technical report discusses the Line Access Test System (LATS) which can perform matrix switching operations on four wire circuits. Each circuit accessed may be tested for D.C. voltage, resistance, A.C. voltage and capacitance. A microprocessor control implementation is also included with the necessary programs for operation. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 15, 1979
Accession Number
ADA072768

Entities

People

  • John Mccormack
  • Mike Verstegen

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Capacitance
  • Communication Systems
  • Computer Programming
  • Computer Programs
  • Computers
  • Control Panels
  • Crossbar Switches
  • Electronics
  • Engineering
  • Indicator Lights
  • Indicators
  • Keyboards
  • Microprocessors
  • Switches
  • Systems Engineering

Readers

  • Electrical Engineering
  • Parallel and Distributed Computing.