Raster-Scan Display Photometric Noise Measurement.
Abstract
This report describes the results of two studies designed to measure dynamic noise, photometrically, on a raster-scan display. One study evaluated spot microphotometry of a single raster line; the other evaluated microdensitometric power spectral analysis of close-up photographs of raster lines. The spot microphotometry technique proved superior and very reliable, yielding results that are highly correlated with input noise spectra. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1979
- Accession Number
- ADA073024
Entities
People
- David I. Shedivy
- Harry L. Snyder
- Maier Almagor
Organizations
- Virginia Tech