AUGER ELECTRON SPECTROSCOPY STUDIES OF OXIDE FILMS ON AL-ZN-MG ALLOYS,

Abstract

Auger electron spectroscopy and depth profiling have been used to obtain information on the composition of oxide films formed on high purity Al-5.5Zn-2.5Mg alloys as a function of heat treatment, grain size, storage environment and temperature. These studies show that in the as-heat-treated condition the oxide film is predominantly MgO. The Mg/O peak-to-peak height ratio of this oxide is sensitive to the heat treatment temperature and exhibits a maximum at 475 C. During subsequent storage, especially in a moist environment, this film undergoes substantial changes in composition. The Mg/Al ratio of the oxide decreases due to formation of an Al-rich oxide on top of the as-heat-treated oxide. A model is proposed to account for the changes in the oxide film composition during growth of the Al-rich oxide, and possible implications to pre-exposure embrittlement and stress corrosion cracking are discussed. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1979
Accession Number
ADA073096

Entities

People

  • J. A. S. Green
  • R. K. Viswanadham
  • T. S. Sun

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Chemical Composition
  • Corrosion
  • Electron Energy
  • Electron Spectroscopy
  • Electrons
  • Films
  • Grain Boundaries
  • Grain Size
  • Heat Treatment
  • Materials
  • Oxide Films
  • Oxides
  • Spectroscopy
  • Stress Corrosion
  • Stress Corrosion Cracking

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene