Electrical Overstress Program.

Abstract

This report is a description of initial work on a program to provide information needed in the development of a nondestructive screen to eliminate junction bipolar devices especially suspectible to damage after second breakdown. Based on the results of the first 8 months of work, the decision has been made that the major thrust of the program should be towards identifying the reasons why specific samples of a given device type are unusually susceptible, rather than determining nominal susceptibility of generic types.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1978
Accession Number
ADA073148

Entities

People

  • D. Mathews
  • P. P. Budenstein

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computational Science
  • Computer Simulations
  • Computers
  • Crystal Structure
  • Differential Equations
  • Electrical Conductivity
  • Electrical Engineering
  • Electrical Properties
  • Electronics
  • Geometry
  • Ionizing Radiation
  • Light Sources
  • P-N Junctions
  • Semiconductor Devices
  • Semiconductor Junctions
  • Semiconductors
  • Thermal Conductivity

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design