Reliability Test and Evaluation of MIL-M-38510 Linear Microcircuits

Abstract

The objective of this effort is to provide analysis and evaluation of high reliability linear microcircuits to assure adequate test methods, reliability prediction and specification for high reliability Air Force Electronics. Data from this effort including processing information, materials, design characteristics, electrical measurements, temperature coefficients, stabilities, application information, test methods, burn-in procedures, specification, and reliability data will be used by the Government to assure high reliability in systems using these devices.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1979
Accession Number
ADA073455

Entities

People

  • Roy C. Maurer

Organizations

  • McDonnell Douglas

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Circuit Boards
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Field Effect Transistors
  • Life Tests
  • Measurement
  • Modules (Electronics)
  • P-N Junctions
  • Power Electronics
  • Printed Circuit Boards
  • Printed Circuits
  • Semiconductor Devices
  • Semiconductors
  • Specifications
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Fields of Study

  • Engineering

Readers

  • Inertial Navigation Systems.
  • Software Engineering

Technology Areas

  • Microelectronics