Measurement of Polarized Light Scattering via the Mueller Matrix

Abstract

A new instrument for rapid and accurate measurement of the Mueller matrix is described. Distinct measurements of all sixteen elements are made simultaneously and with an absolute accuracy of 1% to 5%. The instrument employs electro-optic modulators. Results are presented for several simple optical devices and systems. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 04, 1979
Accession Number
ADA074431

Entities

People

  • Edward S. Fry
  • Jerold R. Bottiger
  • Randall C. Thompson

Organizations

  • Texas A&M University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Detectors
  • Diameters
  • Dielectric Polymers
  • Difference Frequency
  • Electric Fields
  • Electro-Optic Modulators
  • Electromagnetic Radiation
  • Light Scattering
  • Measurement
  • Modulators
  • Optical Properties
  • Particles
  • Pockels Cells
  • Refractive Index
  • Standards
  • Waveplates

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Optical Physics and Photonics.
  • Research Science/Academic Research