Neutron Hardness Assurance Guidelines for Semiconductor Devices.
Abstract
This guideline document develops a systematic approach to guarantee system survival at some specified probability of survival and neutron environmental level. The approach is analogous to a filtering process in which increasingly complex and costly levels of effort are applied until all system piece-parts have acceptable probabilities of survival. Branch decisions in the procedure are based on a statistical evaluation of manufacturer-to-manufacturer and lot-to-lot variations in piece-part neutron responses. Hardness assurance is part of the total quality assurance effort and includes all control, monitoring, and evaluation efforts needed to procure systems whose nuclear hardness equals or exceeds that of the design-hardened engineering prototype throughout production and system life. Hardness assurance efforts during the production phase are made part of the piece-part procurement specification. Example procurement specifications are given in this document for bipolar transistors, diodes, transistor-transistor logic integrated circuits, operational amplifiers (101A, 741, and 108A types), and junction-field effect transistors. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1979
- Accession Number
- ADA074882
Entities
People
- Robert A. Berger