Direct Measurement by Secondary-Ion Mass Spectrometry of Self-Diffusion of Boron in Fe40Ni40B20 Glass.
Abstract
The available methods for measuring diffusion rates of various metalloids in metallic glasses are critically reviewed, and the advantages of studying boron diffusion by secondary-ion mass-spectrometry (SIMS) set out. A surface coating of chemical composition similar to that of the glass but enriched in 10(B) was deposited on the polished glass by sputtering in an ultraclean environment. The samples were diffusion-annealed and profiled by SIMS. Subsequent tests showed that some samples had partly crystallized and these had anomalously low diffusion rates.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1979
- Accession Number
- ADA075782
Entities
People
- C. Kenway Jackson
- J. E. Evetts
- J. Patterson
- R. E. Samekh
- R. W. Cahn
Organizations
- University of Sussex