Microcircuit Device Reliability Digital Failure Rate Data. Summer 1979,

Abstract

This compendium of microcircuit device reliability is desired into two parts: Digital Failure Rate Summarized Data and Digital Device Data-Detailed Listings. The summaries pertain to warranty experience, and generic field, reliability demonstration, equipment checkout and life test data. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1979
Accession Number
ADA077199

Entities

People

  • David B. Nicholls

Organizations

  • IIT Research Institute

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Data Analysis
  • Databases
  • Failure Mode And Effect Analysis
  • Fish
  • Information Science
  • Life Tests
  • Metal Oxide Semiconductors
  • Operating Systems
  • Plastic Explosives
  • Reliability
  • Semiconductors
  • Silicon Carbide
  • Supply Chain Management
  • Systems Engineering
  • Test And Evaluation
  • Three Dimensional
  • Transistor Transistor Logic

Readers

  • Business Analytics
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Statistical inference.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems