Storage Reliability of Chip and Bond Wire Electronic Devices. Volume II. Test Results.

Abstract

Storage reliability and parameter drift rates were measured on 10,027 Minuteman chip and bond wire Resistor-Transistor Logic (RTL) devices, which have been in storage since mid-1967 (eight years). This volume tabulates all parameter measurements made on each part tested.

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Document Details

Document Type
Technical Report
Publication Date
Dec 08, 1975
Accession Number
ADA077486

Entities

Organizations

  • Boeing

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Computers
  • Data Analysis
  • Data Sets
  • Digital Information
  • Intellectual Property
  • Logic
  • Logic Devices
  • Measurement
  • Network Protocols
  • Operating Systems
  • Plastic Explosives
  • Reliability
  • Standards
  • Three Dimensional

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Parallel and Distributed Computing.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems